upload
National Semiconductor Corporation
المجال: Semiconductors
Number of terms: 2987
Number of blossaries: 0
Company Profile:
National Semiconductor Corporation designs, develops, manufactures, and markets analog and mixed-signal integrated circuits and sub-systems.
A quality control system utilizing statistical analysis of process defect data to detect quality trends on a real time basis.
Industry:Semiconductors
Gross quantitative data indicating the total number of devices subjected to and passing or failing the various screening steps in a test sequence.
Industry:Semiconductors
A plane through a device established for the purpose of orienting the application of force during such stresses as constant acceleration. The most widely used axis is the Y1 axis, in which the application of force is such it will tend to lift the die off the mounting surface or the wires off the die.
Industry:Semiconductors
Random witnessing of testing or screening of devices to determine that the material meets all applicable requirements.
Industry:Semiconductors
A test whereby devices are stored for short periods (15 minutes) alternately at high and low temperatures in gas filled chambers, with a maximum transfer time between chambers of one minute. Normally 10 cycles are performed from -65° to + 1 WC. This stresses device assembly because of the different thermal coefficients of expansion of the various materials used.
Industry:Semiconductors
Normally stated in terms of °C/W, it is the indicator of the package's ability to dissipate the heat generated by the chip during operation. ?JC is the indicator of the chip's ability to pass the heat generated by the semiconductor junctions to the package, that is the thermal resistance between the semiconductor junction and the case; ?JA is the thermal resistance between the semiconductor junction and the ambient environment, or the indicator of the case's ability to pass chip heat into the ambient air.
Industry:Semiconductors
Electrical test of semiconductor devices at the wafer level, so named because a metal probe is used to make electrical contact with each of the device's bonding pads.
Industry:Semiconductors
A circuit element fabricated on a semiconductor device (usually adjacent to the device input) for the purpose of protecting portions of the device circuitry from transient overstress. A good example of a protective device would be an input diode on a CMOS device, which absorbs electrostatic discharge to prevent that discharge from rupturing the gate oxide.
Industry:Semiconductors
Conformance to a set of predetermined design and workmanship standards. Quality and reliability are not synonymous.
Industry:Semiconductors
A list of those suppliers and/ or devices which have been qualified for a given program, specification or set of specifications.
Industry:Semiconductors